Some Recent Publications

• Hahn, G.J. and Meeker, W.Q. (1993) The Assumptions of Statistical Inference. The American Statistician 47, 1-11.

• Lu, C.J., and Meeker, W.Q. (1993), Using Degradation Measures to Estimate a Time-to-Failure Distribution. Technometrics 35, 161-174.

• Meeker, W. Q., and Escobar, L. A. (1993), A Review of Recent Research and Current Issues in Accelerated Testing. International Statistical Review 61, 147-168.

• Arnold, B. C., Beaver, R. J., Groeneveld, R. A., and Meeker, W. Q. (1993), The Nontruncated Marginal of a Truncated Bivariate Normal Distribution, Psychometrika 58, 471-488.

• Meeker, W. Q., and Escobar, L. A. (1994), An Algorithm to Compute the cdf of the Product of Two Normal Random Variables, Communications in Statistics 23, 271-280.

• Meeter, C.A., and Meeker, W.Q. (1994), Optimum Accelerated Life Tests with Nonconstant Scale Parameter. Technometrics 36, 71-83.

• Escobar, L. A., and Meeker, W. Q. (1994), Fisher Information Matrix for the Extreme Value, Normal, and Logistic Distributions and Censored Data , Applied Statistics, 43, 533-540.

• Olin, B. D. and Meeker, W. Q., (1994), Applications of Experimental Design in Nondestructive Evaluation, In Thompson, D. O. and Chimenti, D. E, editors, Review of Progress in Quantitative Nondestructive Evaluation 13, 2199-2206. Plenum Press.

• Garrigoux, C. G. and Meeker, W. Q. (1994), A Reliability Model for Planning In-Service Inspections for Components Subject to Degradation Failure, Pakistan Journal of Statistics, 10 79-98.

• Meeker, W. Q., and Escobar, L. A. (1994), Maximum Likelihood Methods for Fitting Parametric Statistical Models to Censored and Truncated Data. In Probabilistic and Statistical Methods in the Physical Sciences, edited by John Stanford and Stephen Vardeman, New York: Academic Press.

• Garrigoux, C. G. and Meeker, W. Q. (1995), Assessing the Effect of In-Service Inspections on the Reliability of Degrading Components, Recent Advances in Life-Testing and Reliability, N. Balakrishnan (Editor), CRC Press.

• Meeker, W. Q., and LuValle, M. J. (1995), An Accelerated Life Test Model Based on Reliability Kinetics. Technometrics 37, 133-146.

• Meeker, W. Q. and Escobar, L. A. (1995), Teaching About Approximate Confidence Regions Based on Maximum Likelihood Estimation, The American Statistician 49, 48-53.

• Meeker, W. Q. and Hamada, M. (1995), Statistical Tools for the Rapid Development &Evaluation of High-Reliability Products, IEEE Transactions on Reliability R-44, 187-198.

• Moore, D. S., Cobb, G. W., Garfield, J., and Meeker, W. Q. (1995), Statistics Education Fin de Siècle, The American Statistician 49, 250-260.

• Escobar, L. A., and Meeker, W. Q. (1995), Planning Accelerated Life Tests with Two or More Factors. Technometrics 37, 411-427.

• Olin, B. D. and Meeker, W. Q., (1996), Applications of Statistics in Nondestructive Evaluation. (with discussion) Technometrics 38, 95-112.

• Cannon, A. R. and Meeker, W. Q. (1996), Statistical Tests for Signals in Categorical Temporal Data. Biometrical Journal 38, 39-59.

• Lu, C. J., Meeker, W. Q., and Escobar, L. A. (1996), A Comparison of Degradation and Failure-Time Analysis Methods of Estimating a Time-to-Failure Distribution. Statistica Sinica 6, 531-546.

• Marasinghe, M., Meeker, W., Cook, D., and Shin, T. (1996), Using Graphics and Simulation to Teach Statistical Concepts. The American Statistician, 50 xxx-xxx (in press).